구형 부품의 운영정보를 고려한 무고장 신형 전력반도체의 베이지안 신뢰도 특성 연구

Study on Bayesian Reliability Characteristics of New Power Semiconductor for Zero Failures Considering Operational Information of Old Components

초록

An important difference between classical and Bayesian statistics is that Bayesian statistics use a prior distribution. Even when there is insufficient data in the reliability analysis, successful results can be derived if an appropriate prior distribution is used. In this paper, by analyzing the failure information of old parts that have been discontinued, the gamma distribution and the simple uniform distribution were proposed as prior distributions for new parts by considering average values and deviations. Here, by mathematically transforming the likelihood function, the Bayesian reliability characteristics of new parts with no failure characteristics were studied. It was found that it is possible to calculate the quantitative reliability value of zero failures information, which cannot be done in classical statistics. Also, in the case of the prior distribution developed with the uniform distribution and the gamma distribution, both prior distributions can produce quantitative values, but the model of the prior distribution made from the gamma distribution is expected to give a more explicit effect to field technicians in interpreting the posterior distribution.

키워드

전력소자베이지안깁스-샘플링Zero failureBayesian reliabilityGibbs sampling
제목
구형 부품의 운영정보를 고려한 무고장 신형 전력반도체의 베이지안 신뢰도 특성 연구
제목 (타언어)
Study on Bayesian Reliability Characteristics of New Power Semiconductor for Zero Failures Considering Operational Information of Old Components
저자
조동철구정서김길동황정택
DOI
10.7782/JKSR.2022.25.6.399
발행일
2022-06
저널명
한국철도학회논문집
25
6
페이지
399 ~ 407