A Study on the Reliability Demonstration of ATC and IXL for Korea High Speed Train

초록

This paper provides a scheme for Highly Accelerated Stress Test (HAST) that is necessary to demonstrate reliability prediction of Korea High Speed Train Control System (TCS) sub-system, which is calculated by the standard for failure rate prediction of electronic products. Although determining failure rate information generated in the process of trial running by statistic analysis is widely accepted as a measure of confirmation for reliability prediction, this paper suggests the modeling for system life test determined by accelerating stress factors as a measure of confirmation for reliability prediction of sub-system that is generated before a trial running in system life cycle. Consequently, the research demonstrates subsystem reliability test, which is based on the model derived from Accelerated Stress Test (AST), according to confidence level and the number of samples, and conducts an official experiment by making out a reliability test procedure sheet based on test time as well.